Scaling in the Contact Process

Scaling properties of an interface representation of the critical contact process are studied in dimensions 1 3. Simulations confirm the scaling relation βW = 1−θ between the interface-width growth exponent βW and the exponent θ governing the decay of the order parameter. A scaling property of the height distribution, which serves as the basis for this relation, is also verified. The height-height correlation function shows clear signs of anomalous scaling, in accord with López’ analysis [Phys. Rev. Lett. 83, 4594 (1999)], but no evidence of multiscaling. PACS numbers: 64.60.Ht, 05.40.-a, 05.10.Ln, 05.90.+m Typeset using REVTEX